IEC/TS 62215-2-2007 集成电路.脉冲抗扰度的测量.第2部分:同步瞬时注射法
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【英文标准名称】:Integratedcircuits-Measurementofimpulseimmunity-Part2:Synchronoustransientinjectionmethod
【原文标准名称】:集成电路.脉冲抗扰度的测量.第2部分:同步瞬时注射法
【标准号】:IEC/TS62215-2-2007
【标准状态】:现行
【国别】:国际
【发布日期】:2007-09
【实施或试行日期】:
【发布单位】:国际电工委员会(IEC)
【起草单位】:IEC/SC47A
【标准类型】:()
【标准水平】:()
【中文主题词】:检验设备;定义;电气工程;进料器;影响量;集成电路;干扰抑制;测量;测量条件;动量;印制电路板;试验报告;试验组织;测试
【英文主题词】:Checkingequipment;Definition;Definitions;Electricalengineering;Feeder;Influencequantities;Integratedcircuits;Interferencerejections;Measurement;Measurementconditions;Momentum;Printed-circuitboards;Testreports;Testset-ups;Testing
【摘要】:IEC/Ts62215-2,whichisatechnicalspecification,containsgeneralinformationanddefinitionsonthetestmethodtoevaluatetheimmunityofintegratedcircuits(ICs)againstfastconductedsynchronoustransientdisturbances．Thisinformationisfollowedbyadescriptionofmeasurementconditions,testequipmentandtestset—upaswellasthetestproceduresandtherequirementsonthecontentofthetestreport．theobjectiveofthistechnicalspecificationistodescribegeneralconditionstoobtainaquantitativemeasureofimmunityofICsestablishingauniformtestingenvironment．Criticalparametersthatareexpectedtoinfluencethetestresultsaredescribed．Deviationsfromthisspecificationshouldbeexplicitlynotedintheindividualtestreport．thissynchronoustransientimmunitymeasurementmethod,asdescribedinthisspecification．usesshortimpulseswithfastrisetimesofdifferentamplitude,durationandpolarityinaconductivemodetotheIC．Inthismethod,theappliedimpulseshouldbesynchronizedwiththeactivityoftheICtomakesurethatcontrolledandreproducibleconditionscanbeassured．
【中国标准分类号】:L56
【国际标准分类号】:31_200
【页数】:30P.;A4
【正文语种】:英语
【原文标准名称】:集成电路.脉冲抗扰度的测量.第2部分:同步瞬时注射法
【标准号】:IEC/TS62215-2-2007
【标准状态】:现行
【国别】:国际
【发布日期】:2007-09
【实施或试行日期】:
【发布单位】:国际电工委员会(IEC)
【起草单位】:IEC/SC47A
【标准类型】:()
【标准水平】:()
【中文主题词】:检验设备;定义;电气工程;进料器;影响量;集成电路;干扰抑制;测量;测量条件;动量;印制电路板;试验报告;试验组织;测试
【英文主题词】:Checkingequipment;Definition;Definitions;Electricalengineering;Feeder;Influencequantities;Integratedcircuits;Interferencerejections;Measurement;Measurementconditions;Momentum;Printed-circuitboards;Testreports;Testset-ups;Testing
【摘要】:IEC/Ts62215-2,whichisatechnicalspecification,containsgeneralinformationanddefinitionsonthetestmethodtoevaluatetheimmunityofintegratedcircuits(ICs)againstfastconductedsynchronoustransientdisturbances．Thisinformationisfollowedbyadescriptionofmeasurementconditions,testequipmentandtestset—upaswellasthetestproceduresandtherequirementsonthecontentofthetestreport．theobjectiveofthistechnicalspecificationistodescribegeneralconditionstoobtainaquantitativemeasureofimmunityofICsestablishingauniformtestingenvironment．Criticalparametersthatareexpectedtoinfluencethetestresultsaredescribed．Deviationsfromthisspecificationshouldbeexplicitlynotedintheindividualtestreport．thissynchronoustransientimmunitymeasurementmethod,asdescribedinthisspecification．usesshortimpulseswithfastrisetimesofdifferentamplitude,durationandpolarityinaconductivemodetotheIC．Inthismethod,theappliedimpulseshouldbesynchronizedwiththeactivityoftheICtomakesurethatcontrolledandreproducibleconditionscanbeassured．
【中国标准分类号】:L56
【国际标准分类号】:31_200
【页数】:30P.;A4
【正文语种】:英语
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